Last updated: 25/12/2018

Growth Facilities
    UHV MBE/sputter
    HiTUS

Nanofabrication
    e-beam lithography
    Photolithography
    FIB
    Cleanroom

Characterisation
    Probe station
    XRD
    GHz pulse measurement
    Dilution refrigerator
    VSM
    AGFM
    MR prober
    Annealing furnace
    MOKE
    HRTEM/STEM
    TEM
    SEM
    SPM
    Sample preparation
    Particle analyser

High Resolution Transmission Electron Microscope (HRTEM) / Scanning TEM

JEOL JEM-2200FS

HRTEM/STEM
This HRTEM/STEM system is made by JEOL and have the following capabilities:
  • Acceleration voltage: 200 kV
  • Electron gun: ZrO/W Schottky
  • Resolution: < 0.8 nm
  • Magnification: × 2,000 ~ 1,500,000
  • Double aberration correction
  • Energy dispersive X-ray spectroscopy (EDX)
This system belongs to York JEOL Nanocentre directed by Profs. Pratibha Gai and Ed Boyes. See more details on their page.