Last updated: 25/12/2018

Growth Facilities
    UHV MBE/sputter
    HiTUS

Nanofabrication
    e-beam lithography
    Photolithography
    FIB
    Cleanroom

Characterisation
    Probe station
    XRD
    GHz pulse measurement
    Dilution refrigerator
    VSM
    AGFM
    MR prober
    Annealing furnace
    MOKE
    HRTEM/STEM
    TEM
    SEM
    SPM
    Sample preparation
    Particle analyser

Particle Analyser

Carl Zeiss Particle Analyser

Particle Analyser
This analyser is made by Carl Zeiss in 1948 and have the following capabilities:
  • Variable light aperture for adjustable particle sizes
  • Mechanical punch system for size counts
This system belongs to Magnetic Materials Group led by Prof. Kevin O'Grady at the Department of Physics.