Last updated: 25/12/2018

Growth Facilities
    UHV MBE/sputter
    HiTUS

Nanofabrication
    e-beam lithography
    Photolithography
    FIB
    Cleanroom

Characterisation
    Probe station
    XRD
    GHz pulse measurement
    Dilution refrigerator
    VSM
    AGFM
    MR prober
    Annealing furnace
    MOKE
    HRTEM/STEM
    TEM
    SEM
    SPM
    Sample preparation
    Particle analyser

Sample Preparation

Sample Preparation
The York JEOL Nanocentre accommodates the following sample preparation facilities:
  • Disc Grinder
  • Gatan 656 Dimple Grinder
  • Gatan Precision Ion Polishing System (PIPS)
This system belongs to York JEOL Nanocentre directed by Profs. Pratibha Gai and Ed Boyes.