Last updated: 25/12/2018

Growth Facilities
    UHV MBE/sputter
    HiTUS

Nanofabrication
    e-beam lithography
    Photolithography
    FIB
    Cleanroom

Characterisation
    Probe station
    XRD
    GHz pulse measurement
    Dilution refrigerator
    VSM
    AGFM
    MR prober
    Annealing furnace
    MOKE
    HRTEM/STEM
    TEM
    SEM
    SPM
    Sample preparation
    Particle analyser

Scanning Electron Microscope (SEM)

JEOL JSM-7800F Prime

SEM
This SEM system is made by JEOL and have the following capabilities:
  • Acceleration voltage: 0.01 ~ 30 kV
  • Resolution: < 0.8 nm (15 kV) / 1.2 nm (1 kV)
  • Magnification: & times; 25 ~ 1,000,000
  • Working distance: 2 ~ 25 mm
  • Energy dispersive X-ray spectroscopy (EDX)
This system belongs to York JEOL Nanocentre directed by Profs. Pratibha Gai and Ed Boyes. See more details on their page.