Last updated: 25/03/2019

Growth Facilities
    UHV MBE/sputter
    HiTUS

Nanofabrication
    e-beam lithography
    Photolithography
    FIB
    Cleanroom

Characterisation
    Probe station
    XRD
    GHz pulse measurement
    Dilution refrigerator
    VSM
    AGFM
    MR prober
    Annealing furnace
    MOKE
    HRTEM/STEM
    TEM
    SEM
    SPM
    Sample preparation
    Particle analyser

Scanning Probe Microscope (SPM)

nanoscan VLS-80

MFM
This SPM system is made by nanoscan and have the following capabilities:
  • Modes: atomic force microscope (AFM) & magnetic force microscope (MFM)
  • In-plane magnetic field: -5.5 ~ +5.5 kOe
  • Perpendicular magnetic field: -2.0 ~ +2.0 kOe
  • Stage temperature: room temperature

JEOL JSPM-5200

SPM
This SPM system is made by JEOL and have the following capabilities:
  • Modes: atomic force microscope (AFM) & magnetic force microscope (MFM)
  • Stage temperature: 130 ~ 773 K
This system belongs to York JEOL Nanocentre directed by Profs. Pratibha Gai and Ed Boyes. See more details on their page.