Dynamical scanning force microscopy

Scanning probe microscopy measures the local interaction between a sharp tip and the surface of a sample and provides more directly the information about the physical properties of materials or devices. It is therefore very complementary to electron microscopy based imaging and analytical techniques. We have been studying magnetic force imaging using a dynamical scanning force microscope produced by Swissprobe. Using a combination of advanced electron microscopy and magnetic force microscopy, we hope to develop a fundamental understanding of the structure and property relationship in magnetic and spintronics materials.

Imaging principle of magnetic contrast in a magnetic disk by a dynamical scanning probe microscope

(a) the magnetic domains in a magnetic hard disk

(b) the z-component of the stray field

(c) the z-component of the secondary derivative which approaches zero at so-called ‘magnetic silent regions’

Recent publications

H ZHONG, W PENG, G TARRACH, A DRECHSLER, J JIANG, D WEI, J YUAN

Non-contact magnetic force microscopy of recording media by ex situ tip magnetization reversal method

J. Phys. D: Appl. Phys. 41, 085002 (2008) http://www.iop.org/EJ/abstract/0022-3727/41/8/085002

H. ZHONG, G. TARRACH, P. WU, A. DRECHSLER,D. WEI, J. YUAN

High resolution magnetic force microscopy of patterned L1₀-FePt dot arrays by nanosphere lithography

Nanotechnology, 19, 095703 (2008) http://www.iop.org/EJ/abstract/-search=49313300.2/0957-4484/19/9/095703