The main interest in thin films is that they exhibit different and even novel properties compared with bulk samples. We carefully and accurately characterise samples as they are grown in vacuum (in-situ) and ex-situ. In York we have a varied array of techniques which enable us to structurally, chemically, electrically and magnetically characterise sample surfaces. We also have access to equipment in other laboratories to enable further sample analysis. These techniques include:

In-situ characterisation

• Reflection High Energy Electron Diffraction (RHEED)
• Magneto-Optical Kerr Effect (MOKE)
• Ion Bombardment
• Auger Electron Spectroscopy (AES)
• Scanning Tunneling Microscopy (STM)

Ex-situ characterisation

• Vibrating Sample Magnetometry (VSM)
• Alternating Gradient Force Magnetometry (AGFM)
• X-ray diffraction (XRD)
• Magneto-Optical Kerr Effect (MOKE)
• Magneto- and Electrical Transport (Resistance, IV, GMR)
• Ferromagnetic Resonance (FMR)
• Torque Magnetometry

Central facility based techniques

• X-ray Scattering
• Neutron Diffraction
• Medium Energy Ion Scattering (MEIS)
• Electron Spectroscopy
  (RUSTI - Research Unit for Surfaces, Transforms and Interfaces)
• Magnetic Circular X-Ray Dichroism (MXCD)