Sun 12 February, 2012

Scanning Electron Microscopy

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• Instrument Development
• Surface Properties Work

• Auger Spectroscopy
• Low Energy Electron Diffraction
• Medium Energy Ion Scattering
• Metastable De-excitation Spec.
• Scanning Auger Microscopy
• Scanning Probe Microscopy
• Scanning Electron Microscopy
• Ultra-violet Photoelectron Spec.

• 2π Electron Diffractometer
• The HFA
• The MDS Apparatus
• The MULSAM Instrument
• The SEM
• The STM/AFM
• The York STM

• Recent Publications
• Theses
• Conferences and Presentations