Exponentially enhanced quantum metrology

Exponentially enhanced quantum metrology

Roy, S.M. and Braunstein, S.L.
(2008): Physical Review Letters 100, 220501-1/4 (PDF)

ABSTRACT: We show that when a suitable entanglement-generating unitary operator depending on a parameter is applied on N qubits in parallel, a precision of the order of 2N in estimating the parameter may be achieved. This exponentially improves the precision achievable in classical and in quantum nonentangling strategies.