Application of Aberration-corrected electron microscopy in resolving atomic and electronic structures of interfaces

Interfaces are the important link between different materials as well as breeding grounds for new phases and novel phenomena. They have long being the object of fascination, but remain relatively inaccessible, for example, comparing to surfaces of solids. With the development of atom-resolving electron microscopy such as that available in York JEOL Nanocentre and the application of atomically resolved EELS spectroscopic technique, we are uncovering the complexity of interfaces in materials and devices both large and small.

Interfaces in Boron-rich nanowires

Monolayer segregation of Ba atoms seen in Boron suboxide nanowires using High angle annular dark field Scanning Transmission Electron Microscope (HADDF-STEM)

Interface in ferrite materials

X ZHANG, WG WANG, LN ZHANG, JJ QI AND J YUAN

Correlation of bonding of grain boundary and fracture mode with local electronic structure in steels by electron energy loss spectroscopy
Appl. Phys. Letts., 90, 171905 (2007).

XZ ZHANG, LN ZHANG, Y MA AND J YUAN

Electronic Structure Characterization of Bonding of Grain Boundaries and Fracture Mode of Steels
Acta Metallurgica Sinica, 41(6), 617-621 (2005).