Last updated: 08/09/2020

Growth Facilities
UHV MBE/sputter
HiTUS

Nanofabrication
e-beam lithography
Photolithography
FIB
Cleanroom

Characterisation
Probe station
XRD
GHz pulse measurement
Dilution refrigerator
VSM
AGFM
MR prober
Probe station
Annealing furnace
MOKE
HRTEM/STEM
TEM
SEM
SPM
Sample preparation
Particle analyser

Scanning Probe Microscope (SPM)

nanoscan VLS-80

MFM

This SPM system is made by nanoscan and have the following capabilities:

Modes: atomic force microscope (AFM) & magnetic force microscope (MFM)
In-plane magnetic field: -5.5 ~ +5.5 kOe
Perpendicular magnetic field: -2.0 ~ +2.0 kOe
Stage temperature: room temperature

This system was purchased by JST-CREST grant.

JEOL JSPM-5200

SPM

This SPM system is made by JEOL and have the following capabilities:

Modes: atomic force microscope (AFM) & magnetic force microscope (MFM)
Stage temperature: 130 ~ 773 K

This system belongs to York JEOL Nanocentre directed by Profs. Pratibha Gai and Ed Boyes. See more details on their page.