Last updated: 11/09/2019
Growth Facilities
UHV MBE/sputter
HiTUS
Nanofabrication
e-beam lithography
Photolithography
FIB
Cleanroom
Characterisation
Probe station
XRD
GHz pulse measurement
Dilution refrigerator
VSM
AGFM
MR prober
Probe station
Annealing furnace
MOKE
HRTEM/STEM
TEM
SEM
SPM
Sample preparation
Particle analyser
Transmission Electron Microscope (TEM)
JEOL JEM-2011
- Acceleration voltage: 200 kV
- Electron gun: LaB6
- Resolution: < 1.0 nm
- Magnification: & times; 1,000 ~ 2,000,000
- Energy dispersive X-ray spectroscopy (EDX)