Last updated: 11/09/2019

Growth Facilities
UHV MBE/sputter
HiTUS

Nanofabrication
e-beam lithography
Photolithography
FIB
Cleanroom

Characterisation
Probe station
XRD
GHz pulse measurement
Dilution refrigerator
VSM
AGFM
MR prober
Probe station
Annealing furnace
MOKE
HRTEM/STEM
TEM
SEM
SPM
Sample preparation
Particle analyser

X-Ray Diffractometer (XRD)

Rigaku SmartLab

XRD

This XRD system is made by Rigaku and have the following capabilities:

9 kW XRD source
Ge(220) 20bounce monochrometer
Angle resolution: 0.005°
Automatic divergence and receiving slits control
Automatic optics alignment
High-resolution vertical θ/θ 4-circle goniometer

2θ: -3 ~ 160°
scanning speed: 0.01 ~ 50° with 0.0001°
in-plane: -3 ~ 120° with 0.002° step

7-axes horizontal sample stage and Eulerian cradle

X-Y control: -10 ~ 10 mm with 0.0005 mm step
Z control: -4 ~ 1 mm with 0.0005 mm step
χ control: -5 ~ 95° with 0.001° step
φ control: -720 ~ 720° with 0.001° step

Dynamic range in X-ray reflectivity: > 10⁷

This system was purchased by EU-JST HARFIR grant.