Last updated: 25/12/2018

Growth Facilities
    UHV MBE/sputter
    HiTUS

Nanofabrication
    e-beam lithography
    Photolithography
    FIB
    Cleanroom

Characterisation
    Probe station
    XRD
    GHz pulse measurement
    Dilution refrigerator
    VSM
    AGFM
    MR prober
    Annealing furnace
    MOKE
    HRTEM/STEM
    TEM
    SEM
    SPM
    Sample preparation
    Particle analyser

Transmission Electron Microscope (TEM)

JEOL JEM-2011

TEM
This TEM system is made by JEOL and have the following capabilities:
  • Acceleration voltage: 200 kV
  • Electron gun: LaB6
  • Resolution: < 1.0 nm
  • Magnification: & times; 1,000 ~ 2,000,000
  • Energy dispersive X-ray spectroscopy (EDX)
This system belongs to York JEOL Nanocentre directed by Profs. Pratibha Gai and Ed Boyes.