Last updated: 25/12/2018

Growth Facilities
    UHV MBE/sputter
    HiTUS

Nanofabrication
    e-beam lithography
    Photolithography
    FIB
    Cleanroom

Characterisation
    Probe station
    XRD
    GHz pulse measurement
    Dilution refrigerator
    VSM
    AGFM
    MR prober
    Annealing furnace
    MOKE
    HRTEM/STEM
    TEM
    SEM
    SPM
    Sample preparation
    Particle analyser

X-Ray Diffractometer (XRD)

Rigaku SmartLab

XRD
This XRD system is made by Rigaku and have the following capabilities:
  • 9 kW XRD source
  • Ge(220) 20bounce monochrometer
  • Angle resolution: 0.005°
  • Automatic divergence and receiving slits control
  • Automatic optics alignment
  • High-resolution vertical θ/θ 4-circle goniometer
    • 2θ: -3 ~ 160°
    • scanning speed: 0.01 ~ 50° with 0.0001°
    • in-plane: -3 ~ 120° with 0.002° step
  • 7-axes horizontal sample stage and Eulerian cradle
    • X-Y control: -10 ~ 10 mm with 0.0005 mm step
    • Z control: -4 ~ 1 mm with 0.0005 mm step
    • χ control: -5 ~ 95° with 0.001° step
    • φ control: -720 ~ 720° with 0.001° step
  • Dynamic range in X-ray reflectivity: > 107
This system was purchased by EU-JST HARFIR grant.